X-Ray Diffraction


The x-ray diffractometers in the AMCL are available to researchers to provide phase identification and texture analysis. These instruments provide diffraction intensity data that can then be compared to the JCPDS and ICDD databases in the lab to confirm the phase identification. In addition, Rietveld analysis programs are available to provide quantitative analysis of mixtures.


For more information, or to reserve time on one of these instruments, please click the appropriate button on the left of this page.