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Dr. Scott Miller
Advanced Materials Characterization Lab
The Philips X-Pert Multi-purpose Diffractometer is equipped with a PiXcel detector and 15 sample changer, allowing for rapid data collection with excellent signal to noise ratio. It features both a Pt and W heating strip with maximum temperature capabilities of 1500C and 2300C respectively. The instrument is also equipped with a small angle X-ray scattering (SAXS) attachment.
Direct questions to Eric Bohannan