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amcl » amcl.mst.edu » X-Ray Diffraction » PANalytical X'Pert Pro (MPD) » Capabilities
PANalytical X'Pert Pro Multi-Purpose Difftometer (MPD) Capabilities

 

The Philips X-Pert Multi-purpose Diffractometer  is equipped with a PiXcel detector and 15 sample changer, allowing for rapid data collection with excellent signal to noise ratio.  It features both a Pt and W heating strip with maximum temperature capabilities of 1500C and 2300C respectively.  The instrument is also equipped with a small angle X-ray scattering (SAXS) attachment.


 Direct questions to Eric Bohannan 

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