The x-ray diffractometers in the AMCL are available to researchers to provide phase identification and texture analysis. These instruments provide diffraction intensity data that can then be compared to the JCPDS and ICDD databases in the lab to confirm the phase identification. In addition, Rietveld analysis programs are available to provide quantitative analysis of mixtures.

For more information, or to reserve time on one of these instruments, please click the appropriate button on the left of this page.

The operation and maintenance of these instruments is made possible by charging a usage fee for each instrument, which is indicated on the individual instrument pages at the left. If a Missouri S&T researcher is in the preproposal stage, and wishes to apply for unfunded use of the instrumentation, a form is available below to initiate that process.

Application for unfunded use of instrument