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Dr. Scott Miller
Advanced Materials Characterization Lab
The Philips X-Pert Diffractometer is a specialized diffractometer best suited for thin film studies. A variety of switchable PREFIX optics modules are available that allow for grazing incidence diffraction of thin films, stress and texture analysis, as well as high resolution studies of epitaxial films, including rocking curves and reciprocal space mapping.
Direct questions to Eric Bohannan