Kratos Axis 165 X-Ray Photoelectrons Spectrometer : Capabilities
The KRATOS AXIS 165 X-ray Photoelectron Spectrometer (XPS) uses either a Magnesium, Aluminum, or Monochromatic Aluminum X-ray source to excite the sample surface. The resultant photoelectrons and auger energies that are detected provide a spectral fingerprint of the elements contained on the upper most, atomic surface layers, and can also provide chemical binding information based on the energy position of the peaks. Samples can also be argon ion etched into atomic depth levels of interest, for analysis of an areas below the immediate surface (ie. interface between layers for depth profiling). Depth of field for the detected photoelectrons is as far as 10 to 80 angstroms, depending on the sample composition.
Direct questions to Brian Porter