Chemical analysis of the topmost atomic layers of materials is accomplished by the methods of auger electron spectroscopy and x-ray photoelectron spectroscopy. These methods provide atomic identification and binding energy information in addition to depth profiling of thin film specimens.

For more information, or to reserve time on one of these instruments, please click the appropriate button on the left of this page.

The operation and maintenance of these instruments is made possible by charging a usage fee for each instrument, which is indicated on the individual instrument pages at the left. If a Missouri S&T researcher is in the preproposal stage, and wishes to apply for unfunded use of the instrumentation, a form is available below to initiate that process.

Application for unfunded use of instrument