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Problems, comments,
suggestions?
Please let us know
how we may serve you better.
Dr. Scott Miller
Director
Advanced Materials
Characterization Lab
(573) 341-4727
The Digital Instruments Nanoscope IIIa is a multimode scanning probe microscope capable of performing scanning tunneling microscopy, atomic force microscopy (tapping and contact mode), and magnetic force microscopy.
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| photo by Samuel O'Keefe |
Direct questions to Eric Bohannan -- bohannan@mst.edu