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Problems, comments,
suggestions?
Please let us know
how we may serve you better.
Dr. Scott Miller
Director
Advanced Materials
Characterization Lab
(573) 341-4727
The atomic force and scanning tunneling microscopes in the AMCL are available to researchers to provide atomic resolution surface images. These images can be obtained in several different modes to give topographic or compositional information from the specimen surface.
For more information, or to reserve time on one of these instruments, please click the appropriate button on the left of this page .