The atomic force and scanning tunneling microscopes in the AMCL are available to researchers to provide atomic resolution surface images. These images can be obtained in several different modes to give topographic or compositional information from the specimen surface.

For more information, or to reserve time on one of these instruments, please click the appropriate button on the left of this page.

The operation and maintenance of these instruments is made possible by charging a usage fee for each instrument, which is indicated on the individual instrument pages at the left. If a Missouri S&T researcher is in the preproposal stage, and wishes to apply for unfunded use of the instrumentation, a form is available below to initiate that process.

Application for unfunded use of instrument