The characterization equipment available in the AMCL includes the following: four scanning electron microscopes (SEM), and a transmission electron microscope (TEM), all of which are combined with energy dispersive x-ray spectroscopy (EDS) systems;four x-ray diffractometers;scanning tunneling and atomic force microscopes, auger electron and x-ray photoelectron spectrometers; and instruments for thermal analysis, including thermogravitimetric analysis and differential scanning calorimetry.

Training in these methods and assistance in the use of the equipment are provided to faculty researchers, graduate and undergraduate students by the director and staff of the AMCL

	A Sample of AMCL Equipment

photos by Samuel O'Keefe