FEI Tecnai F20 is a 200kV field emission gun (FEG) high resolution TEM/STEM which was installed in 2010. The microscope has a SuperTwin objective lens with a Cs of 1.2 mm. With its 200 kV acceleration voltage and its Schottky field emission source, this instrument provides outstanding stability, ease-of-use and high-resolution performance in TEM/STEM imaging and micro-analysis.

The scope is equipped with an Oxford ultra-thin window EDX detector, a Gatan ORIUS wide-angle CCD, a Gatan ultra-scan CCD and annular bright field/dark field detectors for STEM imaging.

• A Schottky Field emitter (FEG) giving high brightness, low energy spread and very small probe sizes
• Operation voltage 80, 120 and 200KV
• Point resolution: 0.24 nm
• Information limit: 0.14 nm
• Energy resolution in EDX: 134eV
• Magnification range: 21x - 1050 kx in TEM mode; Up to 5000 kx in STEM mode
• Magnification reproducible within ± 1.5%
• Camera Length range: 30 – 4500 mm in TEM-diffraction mode
• Coma-free alignment for high-resolution objective-lens centering
• Rotation-free magnification and diffraction series
• Fully computer-controlled, eucentric side-entry, high stability CompuStage
• Double tilt low background analytical specimen holder (α +/- 38º, β +/- 28 º)
• Excellent EDX in-hole performance, low system background in EDX, small probes and embedded EDX, spectrum profiling and imaging
• Improved EDS analytical capabilities through specimen drift correction control

Direct questions to Jessica TerBush