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Dr. Scott Miller
Advanced Materials Characterization Lab
FEI Tecnai F20 is a 200kV field emission gun (FEG) high resolution TEM/STEM which was installed in 2010. The microscope has a SuperTwin objective lens with a Cs of 1.2 mm. With its 200 kV acceleration voltage and its Schottky field emission source, this instrument provides outstanding stability, ease-of-use and high-resolution performance in TEM/STEM imaging and micro-analysis.
The scope is equipped with an Oxford ultra-thin window EDX detector, a Gatan ORIUS wide-angle CCD, a Gatan ultra-scan CCD and annular bright field/dark field detectors for STEM imaging.
Direct questions to Jessica TerBush