Missouri University of Science and Technology, Advanced Materials Characterization Laboratory

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Electron Microscopy
X-Ray Diffraction
- Scintag PadV and XDS 2000
- Philips X-Pert
Scanned Probe Microscopy
- Digital Instruments Nanoscope IIIa
Thermal Analysis
- Netzsch Simultaneous TGA/DTA
- TA Instruments DSC
Surface Chemistry
- Physical Electronics Model 545 Auger Microprobe
- Kratos Axis 165 X-Ray Photoelectron Spectrometer
Digital Image System
- Hi-Rox KH-3000
  - Capabilities
  - Internal User Rates

Problems, comments,
suggestions?
Please let us know
how we may serve you better.
Dr. Scott Miller
Director
Advanced Materials
Characterization Lab
(573) 341-4727

Philips EM430T STEM : Operating Instructions

Conditioning the HT (.pdf file)

TEM alignment (.pdf file)

TEM diagram (.pdf file)

TEM controls locations(.pdf file)

Finding the hole in a bulk specimen (.pdf file)

Exposing images (.pdf file)

Shut Down Procedures (.pdf file)

Standard Conditions (.pdf file)

Replacing Film Sheets (.pdf file)

Film Developing (.pdf file)