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Dr. Scott Miller
Advanced Materials Characterization Lab
The Hitachi S-4700 Field Emission Scanning Electron Microscope is equipped with a field emission single crystal tungsten electron gun. The SEM is used for high resolution imaging up to 500,000x. The scope is equipped with an EDAX energy dispersive x-ray unit capable of determining light elements down to Boron. This instrument is capable of determining the crystal orientations of the grains in a sample.
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