The Hitachi S-4700 Field Emission Scanning Electron Microscope is equipped with a field emission single crystal tungsten electron gun. The SEM is used for high resolution imaging up to 500,000x. The scope is equipped with an EDAX energy dispersive x-ray unit capable of determining light elements down to Boron. Also on this scope is the OIM (orientation imaging microscopy) unit from TSL. This instrument is capable of determining the crystal orientations of the grains in a sample.

photo by Samuel O'Keefe