The electron microscopes in the AMCL are available to researchers to provide high-resolution images and microanalysis. The conventional scanning electron microscopes (SEM) can provide imaging to magnifications of 50,000X or more, and the field emission SEM can provide images up to 500,000X. The FEGSEM is also equipped with an electron backscatter pattern system to provide crystallographic information also. The transmission electron microscope (TEM) can provide images up to 550,000x from specially prepared, ultra-thin samples, and also provide electron diffraction patterns from areas as small as 25nm.
For more information, or to reserve time on one of these instruments, please click the appropriate button on the left of this page.